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US Patent Issued to WINBOND ELECTRONICS on April 21 for "Semiconductor structure and method for forming the same" (Taiwanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,941, issued on April 21, was assigned to WINBOND ELECTRONICS CORP. (Taichung City, Taiwan). "Semiconductor structure and method for formin... Read More


US Patent Issued to ASML NETHERLANDS on April 21 for "Metrology methods and apparatuses for lithographic performance parameter evaluation using probability descriptions" (Dutch Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,942, issued on April 21, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Metrology methods and apparatuses for lithograph... Read More


US Patent Issued to Ushio Denki on April 21 for "Exposure apparatus" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,943, issued on April 21, was assigned to Ushio Denki K.K. (Tokyo). "Exposure apparatus" was invented by Naoya Sohara (Tokyo). According t... Read More


US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Extreme ultraviolet source cleaning apparatus, EUV source cleaning method using the same, and substrate processing method including the same" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,944, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Extreme ultraviolet source cleaning appara... Read More


US Patent Issued to CANON on April 21 for "Position measuring method, method for manufacturing article, position measuring apparatus, semiconductor manufacturing apparatus, and imprint apparatus" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,945, issued on April 21, was assigned to CANON K.K. (Tokyo). "Position measuring method, method for manufacturing article, position measur... Read More


US Patent Issued to ASML Netherlands on April 21 for "Metrology method and associated metrology and lithographic apparatuses" (Dutch Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,946, issued on April 21, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Metrology method and associated metrology and li... Read More


US Patent Issued to FUJIFILM Business Innovation on April 21 for "Electrostatic charge image developing toner set, electrostatic charge image developer set, toner cartridge set, process cartridge, image forming apparatus, and image forming method" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,947, issued on April 21, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Electrostatic charge image developing toner set, ele... Read More


US Patent Issued to Ricoh on April 21 for "Image forming method, toner, developer, printed product, toner storage unit, and image forming apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,949, issued on April 21, was assigned to Ricoh Co. Ltd. (Tokyo). "Image forming method, toner, developer, printed product, toner storage u... Read More


US Patent Issued to CANON on April 21 for "Toner" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,950, issued on April 21, was assigned to CANON K.K. (Tokyo). "Toner" was invented by Keisuke Adachi (Tokyo), Shintaro Noji (Shizuoka, Japa... Read More


US Patent Issued to BROTHER KOGYO on April 21 for "Drum cartridge having movable first housing, immovable second housing, and gasket sealing therebetween, and image-forming apparatus using the same" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,951, issued on April 21, was assigned to BROTHER KOGYO K.K. (Nagoya, Japan). "Drum cartridge having movable first housing, immovable secon... Read More